Semi-auto 4 point probe measurement system for Flatpanel display RG-100PV Napson

Mã sản phẩm: RG-100PV |
Thương hiệu: Napson

Giá bán: Liên hệ
Measurement system for thin film on substrate samples for multi-points measurement
Even pitch and random pitch for Max.1,000 points
2-D/3-D square mapping software for even pitch

Yêu Cầu Giá Tốt

Thông tin sản phẩm
Applications


Semiconductor materilas, Solar-cell materials (Silicon, Polysilicon, SiC etc)
New materials, functional materials (Carbon nanotube, DLC, graphene, Ag nanowire etc)
Conductive thin film (Metal, ITO etc)
Diffused sample (or layer)
Silicon-related epitaxial materials, Ion-implantation sample
Others (*Please contact us for details)

Sample sizes
~300x300mm (Option; ~500x500mm)

Measuring range


[R] 1m~200 Ω・cm
[RS] 1m~1,000k Ω/sq (Option; ~10M Ω/sq)

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