Fully automatic(robotic transfer) 4 point probe system for silicon wafer WS-8800 Napson

Mã sản phẩm: WS-8800 |
Thương hiệu: Napson

Giá bán: Liên hệ
Measurement of resistivity, thickness, conductivity(P/N) and temperature
Tester self-test function, wide measuring range
Thickness, measurement position and temperature correction function for silicon resistivity
Number of cassette station can be changed by customers request
Host (CIM) communication and SMIF or FOUP compatible

Yêu Cầu Giá Tốt

Thông tin sản phẩm
Applications


Semiconductor materials, Solar-cell materials (Silicon, Polysilicon, SiC etc)

Sample sizes


3 ~ 8 inch (or 12 inch)


Measuring range


[R] 100μ~1M Ω・cm
[RS] 1m~10M Ω/sq

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