Manual four point probe sheet resistance/resistivity measurement RT70V series Napson

Mã sản phẩm: RT70V series |
Thương hiệu: Napson

Giá bán: Liên hệ
Thickness input with easy JOG dial operation (RT-70V Tester)
Tester self-test function/Auto change-over measurement range function

Yêu Cầu Giá Tốt

Thông tin sản phẩm
Applications


Semiconductor materials, Solar-cell materials (Silicon, Polysilicon, SiC etc)
New materials, functional materials (Carbon nanotube, DLC, graphene, Ag nanowire etc)
Conductive thin film (Metal, ITO etc)
Diffused sample (or layer)
Silicon-related thin films (LTPS etc), IGZO
Silicon-related epitaxial materials, Ion-implantation sample
Chemical compound semiconductor (GaAs Epi, GaN Epi, InP, Ga etc)
Others (*Please contact us for details)


Measuring range


[R] 1μ~3M Ω・cm
[RS] 5m~10M Ω/sq

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Manual four point probe sheet resistance/resistivity measurement RT70V series Napson