Non-contact Mono-crystalline/Polycrystalline Silicon wafer/blick lifetime measurement HF-300 Napson

Mã sản phẩm: HF-300 |
Thương hiệu: Napson

Giá bán: Liên hệ
Non-contact, non-damage measurement by μ-PCD
Suitable for mono-crystalline and polycrystalline silicon sample
Multipoint measurement & mapping image
Passivation with exclusive capsule (for wafer, bulk sample)

Yêu Cầu Giá Tốt

Thông tin sản phẩm
Applications
Silicon wafer, blick(bulk) [Mono-crystalline, Polycrystalline]


Sample sizes
[Wafer] <Square> ~ 210x210mm, <Circle> ~8 inch


[Blick] Max. 210(W) x 210(H) x 500(D) mm


Measuring range
0.1 μS ~ 1000μS (*Compatible to resistivity range ; 0.1 ~ 1,000Ω・cm)


<Laser unit> Type : Semiconductor laser diode,
Wave length : 905nm, Peak power : 60W, Pulse width : 80nS

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