Non-contact measurement wafer sorting system (Robot hand tranceportation) NC-3000R Napson

Mã sản phẩm: NC-3000R |
Thương hiệu: Napson

Giá bán: Liên hệ
High accuracy measurement system for large diameter wafer
Non-contact measurement of resistivity, thickness and conductivity (P/N)
Compact design of Two-stage by measuring area and transfer area
Number of cassette station can be changed by customers requestOption : Add wafer flattness measurement system(FLA-200)

Yêu Cầu Giá Tốt

Thông tin sản phẩm
Applications


Semiconductor materials, Solar-cell materials (Silicon, Polysilicon, SiC etc)
Sample sizes
6 ~ 8 inch, or 12 inch


Measuring range


[R] 1m ~ 200Ω・cm


[Thickness] 150 ~ 800μm (300μm between 150~800μm)


* The range is separated from each Low, Middle, High and S-High probe type

*Please refer the measurement range for each probe type as below;
(1) Low : 0.01~0.5Ω/□ (0.001~0.05Ω‐cm)
(2) Middle : 0.5~10Ω/□ (0.05~0.5Ω‐cm)
(3) High : 10~1000Ω/□ (0.5~60Ω‐cm)
(4) S-High : 1000~3000Ω/□ (60~200Ω‐cm)

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