Non-contact measurement wafer sorting system (Belt drive tranceportation) NC-6800 Napson

Mã sản phẩm: NC-6800 |
Thương hiệu: Napson

Giá bán: Liên hệ
Non-contact measurement of resistivity, thickness and conductivity (P/N)
Number of cassette station can be changed by customers request
Eddy current method for resistivity, Electric capacitance method for wafer thickness
Temperature correction for silicon wafer function

Yêu Cầu Giá Tốt

Thông tin sản phẩm
Applications


Semiconductor materials, Solar-cell materials (Silicon, Polysilicon, SiC etc)
Sample sizes
3 ~ 8 inch


Measuring range


[R] 1m ~ 200Ω・cm


[Thickness] 150 ~ 800μm (300μm between 150 and 800μm is recommended)


* The range is separated from each Low, Middle, High and S-High probe type.
*Please refer the measurement range for each probe type as below;
(1) Low : 0.01~0.5Ω/□ (0.001~0.05Ω‐cm)
(2) Middle : 0.5~10Ω/□ (0.05~0.5Ω‐cm)
(3) High : 10~1000Ω/□ (0.5~60Ω‐cm)
(4) S-High : 1000~3000Ω/□ (60~200Ω‐cm)

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