Life-time measurement system for silicon bulks/ingots by JIS method HF-100DCA Napson

Mã sản phẩm: HF-100DCA |
Thương hiệu: Napson

Giá bán: Liên hệ
Global standard model for the lifetime test of silicon bulk
JIS direct current anodizing method
Data processing by digital oscilloscope and PC with software

Yêu Cầu Giá Tốt

Thông tin sản phẩm
Applications
Silicon ingot, Silicon bulk, Prismatic shape (JIS code)


Sample sizes
*Please contact us in details


Measuring range
50 μS~ 20mS

SẢN PHẨM CÙNG DANH MỤC
Non-contact sheet resistance multi-points measurement system with wide range NC-80MAP Napson
Non-contact sheet resistance /resistivity measurement instrument EC-80 Napson
Fully automatic 4 point probe sheet resistance system with glass cassette EV and glass loading stage RT-3000/RS-1300 Napson
Global standard model for 4 point probe sheet resistance automatic measurement system RT-3000/RG-1000F Napson
Fully automatic 4 point probe sheet resistance system for semiconductor process evaluate WS-3000 Napson
Fully automatic(robotic transfer) 4 point probe system for silicon wafer WS-8800 Napson
Semi-auto 4 point probe measurement system for Flatpanel display RG-100PV Napson
Wide measurement range model of semi-automatic 4 point probe sheet resistance/resistivity measurement RT-3000/RG-2000 Napson
Small foot print model of semi-automatic 4 point probe sheet resistance/resistivity measurement Cresbox Napson
Hand held Sheet resistance measurement instrument DUORES Napson
4 point probe sheet resistance/resistivity measurement with temperature controled system TCR-600 Napson
Manual four point probe sheet resistance/resistivity measurement RT70V series Napson