Kính hiển vi điện tử quét JSM-7610F JEOL

Mã sản phẩm: JSM-7610F |
Thương hiệu: JEOL

Giá bán: Liên hệ
Kính hiển vi điện tử quét
Model: JSM-7610F
Hãng: JEOL

Yêu Cầu Giá Tốt

Thông tin sản phẩm

Live imaging of up to 4 detectors
Specimen chamber for specimens with a diameter of 200 mm (8" wafer) 
A variety of connection flanges, for EDS, EBSD, CL, IR camera, etc.
Air lock system for fast and clean specimen exchange
Optional systems available for high specimens and wafers up to 8" 
Gentle Beam™ for high resolution imaging at extremely low excitation voltages
r-filter system 2nd generation for secondary electron energy filtering
Optionally, different specimen stages
Newly designed, intuitive user interface, easy to operate
SEM operation through operating panel and mouse


Thông số kỹ thuật


Electron optics

Electron source

Field emissions (TFEG)

Acceleration voltage

0.1 to 30 kV

SE detection

in-lens detector with energy filtering

Resolution in SE image

1.3 nm at 1kV, 1.0 nm at 15 kV

Magnification range

25x bis 1,000,000x



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