Small foot print model of semi-automatic 4 point probe sheet resistance/resistivity measurement Cresbox Napson

Mã sản phẩm: Cresbox |
Thương hiệu: Napson

Giá bán: Liên hệ
User programable measurement pattern & programmable measuring pattern
Tester self-test function, wide measuring range
Thickness, edge, temperature correction for silicon wafer
Film thickness conversion function from sheet resistance

Yêu Cầu Giá Tốt

Thông tin sản phẩm
Applications


Semiconductor materilas, Solar-cell materials (Silicon, Polysilicon, SiC etc)
New materials, functional materials (Carbon nanotube, DLC, graphene, Ag nanowire etc)
Conductive thin film (Metal, ITO etc)
Diffused sample (or layer)
Silicon-related epitaxial materials, Ion-implantation sample


Sample sizes
~ 8 inch, ~156x156mm

Measuring range
[R] 1m~300k Ω・cm
[RS] 5m~10M Ω/sq

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