4 point probe sheet resistance/resistivity measurement with temperature controled system TCR-600 Napson

Mã sản phẩm: TCR-600 |
Thương hiệu: Napson

Giá bán: Liên hệ
Applications


Semiconductor materilas, Solar-cell materials (Silicon, Polysilicon, SiC etc)
Conductive thin film (Metal, ITO etc)

Yêu Cầu Giá Tốt

Thông tin sản phẩm
Sample sizes
φ10mm or 5mmX10mm～35mmX35mm or others


Measuring range
10μ～100k Ω・cm

Selling Points

Controlled Thermo-chuck (room temperature～600℃/less than 20 minutes)
600C compatible probe head with 1mm linear
Controlled with vacuum sensor, digital thermo-meter, vacuum gauge and gas flow meter
Temperature measuring accuracy：±（0.5% + 1℃）

SẢN PHẨM CÙNG DANH MỤC
Non-contact sheet resistance multi-points measurement system with wide range NC-80MAP Napson
Non-contact sheet resistance /resistivity measurement instrument EC-80 Napson
Fully automatic 4 point probe sheet resistance system with glass cassette EV and glass loading stage RT-3000/RS-1300 Napson
Global standard model for 4 point probe sheet resistance automatic measurement system RT-3000/RG-1000F Napson
Fully automatic 4 point probe sheet resistance system for semiconductor process evaluate WS-3000 Napson
Fully automatic(robotic transfer) 4 point probe system for silicon wafer WS-8800 Napson
Semi-auto 4 point probe measurement system for Flatpanel display RG-100PV Napson
Wide measurement range model of semi-automatic 4 point probe sheet resistance/resistivity measurement RT-3000/RG-2000 Napson
Small foot print model of semi-automatic 4 point probe sheet resistance/resistivity measurement Cresbox Napson
Hand held Sheet resistance measurement instrument DUORES Napson
4 point probe sheet resistance/resistivity measurement with temperature controled system TCR-600 Napson
Manual four point probe sheet resistance/resistivity measurement RT70V series Napson