Pentagon Technologies™ line of surface particle detectors is the standard in high technology markets for measuring and controlling surface contamination. Particles that accumulate on your critical surfaces or product can reduce yield and reliability. Particles below 100um in diameter are very difficult to see with the naked eye. These particles settle fast and escape routine air monitoring. The QIII LS Surface Particle Detector measures particles in the sub-visible to visible range (5 -300um).
Minimize troubleshooting time by quickly identifying particle sources
Monitor and set limits for particle density on incoming or outgoing materials
Instant measurements of surface particulate
Improve yield by reducing particles in your product
Drive continuous improvement through particle baseline studies
Test to ISO 14644-9 classification of surface cleanliness
Capture counted particles for analysis with optional Particle Analysis Module