SYSTEM 8 Advanced Test Module (ATM) ABI Electronics

The Advanced Test Module is a solution that offers high test capabilities and comprehensive fault diagnosis with a high degree of flexibility. Powerful test combinations ensure the best fault coverage on PCBs or components and include functional, connections, voltage, thermal and V-I signature tests. A sophisticated but easy to use system with minimum user input required ensures that components and PCBs are tested efficiently and faults are detected rapidly.

Features

• Suitable for all logic families (TTL, CMOS, LVTTL, ECL, DTL, LSI, RTL, PECL, LVPECL etc...)
• Power on and power off tests
• Library driven for ease of use
• Detects all common faults with functional, voltage, connections, thermal and V-I tests
• Graphical test generator for customised test vectors
• Board checker function with voltage drive/measure and VI testing
• TestFlow manager for automated test sequences
• Pass / Fail results for inexperienced users
• Data logging capabilities for traceability
• Flexible software with user access control