| X-ray generator |
W Target, 50kVp 1mA |
| Detector |
Si-Pin Diode, (Option : Proportional Counter, SDD) |
| Resolution limit |
SDD : 125eV FWHM at Mn Kα |
| X-ray coverage |
0.3 Collimator (Option : 0.05, 0.1, 0.2, 0.5, 1mm) Auto Change |
| Measuring range |
Al(13) ~ U(92) |
| Sample type |
Multi-Layer, Wide PCB |
| The measurable sample size |
200 × 250 × 10 mm (W × D × H) |
| Key features |
- Auto / Manual Stage Mode
- Measuring the thickness of general metal finishing, Rh, Pd, Au, Ag, Sn and Ni
- Measuring the thickness of multiple thin-films (up to 5 layers) |
| Camera properties |
20times |
| Radiation safety breaker |
Automatic triple blocker
Approval of safety design : NSSC1.30RG001.03 |
| Type of score report |
Saving data in Word or Excel or PDF file / Printing
User customized format |