| X-ray generator |
W Target, 50kVp 1mA |
| Detector |
Si-Pin Diode, (Option : Proportional Counter, SDD) |
| Resolution limit |
SDD : 125eV FWHM at Mn Kα |
| X-ray coverage |
0.3 Collimator (Option : 0.1, 0.2, 0.3, 0.5, 1mm) Auto Change |
| Measuring range |
Al(13) ~ U(92) |
| Sample type |
Solid / Liquid / Powder, Multi-Layer |
| Size of sample chamber |
490 x 450 x 150 mm (W × D × H) |
| size of sample table |
310 x 260 |
| Sample stage moving possible distance |
220 x 200 x 150 |
| Key features |
- Auto / Manual Stage Mode
- Measuring the thickness of general metal finishing, Rh, Pd, Au, Ag, Sn and Ni
- Measuring the thickness of multiple thin-films (up to 5 layers) |
| Camera magnification |
35~80 X |
| Radiation safety breaker |
Automatic triple blocker |
| Type of score report |
Saving data in Excel or PDF file / Printing
User customized format |