Máy đo chiều dày lớp sơn, mạ EX-731 Densoku

Mã sản phẩm: EX-731 |
Thương hiệu: Densoku

Giá bán: Liên hệ
Measuring the very small part in the excellent operability at the highest accuracy 
can also be measured foundation of large size

Double filter employed in the best accuracy, can be measured in the optimum conditions 
achieve alignment prompt position by aligning the mouse-measurement position 
other processing is possible, including the reporting even during measurement in the multitasking feature 
minimum of collimator There can be very measurement of very small part in 0.05φmm

Yêu Cầu Giá Tốt

Thông tin sản phẩm

Features of the fluorescent X-Senshikimaku thickness meter EX-731

Adoption double filter

In addition to the numeric filter, the adoption of mechanical filter (double filter), you can always measured in the best of conditions so that the highest of accuracy is obtained.

Automatic measurement stage

Achieve alignment prompt position by aligning the mouse to the measurement position. Also, if you enter the measurement position, it can also be a continuous automatic measurement. Coordinate correction, corresponding to various patterns by the channel link. Standard plate calibration is also possible automatic measurement.

Enhanced reporting features

By MS-Windows software adoption, easily it can capture measurement screen, report writing function is enhanced. Other processes including reporting even during the measurement in a multi-task function became possible.

Collimator five internal organs

Minimum of collimator can be very measurement of very small part in 0.1φmm.Standard-0.1,0.2,0.5,1.0,2.0 
was further prepared two kinds of special specifications options. 
0.05,0.1,0.2,0.3,0.5 · 
· 0.05 × 0.5,0.5 × 0.05,0.1,0.2,0.5

Self-diagnostic function and the X-ray tube maintenance function

The self-diagnosis function, and promptly deal with the equipment trouble solved. In addition, it supports the maintenance safety by adding the use of time and endurance time display function of the X-ray tube.

Spectrum display in the film thickness measurement

By spectral analysis high-speed processing by the multi-channel, run the spectrum display of the measured object by a simple operation. (Processing speed of about 2 to 3 seconds)

Display of the measurement section monitor image

Captures the X-ray irradiation unit in the Windows screen, display the X-ray irradiation unit. By the collimator, realize the magnification change function of the size of the change.

Display plating adhesion distribution of the measurement object in the visual

Plating thickness distribution of the measured object by a three-dimensional graph display you will see at a glance.

 

 

Be window X-ray tube (optional) by the performance improvement in the (high precision)

   

            This time, the fluorescent X Senshikimaku thickness meter EX-731 will be available Be window X-ray tube (optional) beneath. By using this option, Cr measurement, and greatly improved repeat measurement accuracy in the Ni measurement.

 

            Discussion of performance improvement

 

            Sn measurement of high energy (high atomic number), which is the traditional equivalent, in the case of low energy of Cr and Ni (low atomic number) measurement, but more to the film thickness, Cr at least three times, in the Ni accuracy repeated two more times has been improved. In the case of the surface layer Au in the two-layer measurement, only Kan, intermediate layer Ni has been improved by about 20% in response to the contribution of improved accuracy. Apply For film thickness meter of the fluorescent X-ray method, repeated measurement precision (standard deviation) is due to statistical fluctuation in occur the process of the fluorescent X-ray intensity is obtained, Be window X-ray tube (optional) by, in the case of Cr, it shows that the fluorescent X-ray intensity of at least about 9 times compared with the conventional standard machine is obtained. Therefore, the measurement of conventional equal accuracy, will be possible in a short period of time. By all means, please consider the adoption of this Be window X-ray tube.

 

Measurement screen at the time of

Measurement screen at the time of

Automatic measurement position confirmation

Automatic measurement position confirmation

histogram

histogram

Three-dimensional graph

Three-dimensional graph

Specification of the fluorescent X-Senshikimaku thickness meter EX-731

type Manual stage Automatic stage
Measuring head part Size (mm) 170 × 110 300 × 280
Amount of movement X (mm) 70 80
Y (mm) 70 Sixty
Z (mm) 80 (height up to 150 of the measured object) Fifty
Measured height (maximum) 80 (Option 150) Fifty
Dimensions (mm) 600 (W) × 465 (D) × 730 (H)
Weight (kg) 79 85
Sample load (kg) Three Two
Computer Dimensions (mm) Body 182 (W) × 383 (D) × 372 (H) 
/ monitor 412 (W) × 415 (D ) × 432 (H)
Weight (kg) Body 6.8 / Monitor 2.8
Printer Weight (kg) 3.4
Power supply AC100V ± 10V

(Note) The specifications are subject to change without notice.

X-ray source Oil immersion type small fine focus X-ray tube 
target: tungsten 
tube voltage 50kV 
tube current variable
Irradiation method Top surface vertical irradiation method
Detector Proportional counter
Collimator 5 type (automatic switchable) 
0.1, 0.2, 0.5, 1.0, 2.0Faimm 
(optional) 
: 0.05,0.1,0.2,0.3,0.5, Fai  
: 0.05 × 0.5,0.5 × 0.05,0.1, 0.2, 0.5Fai
Sample observation CCD color camera
Computer PC / AT-compatible type 
17 inches color monitor
Printer Ink-jet printer
Measuring object Atomic number 22 (Ti) ~ 82 (Pb ) 
atomic number 21 or less can be measured by the absorption method
filter Two (Co, Ni) automatic switching
Measurement range Atomic number 22-24: 0.02 to about 20μm 
atomic number 25 to 40: 0.01 to about 30μm 
atomic number 41-51: 0.02 to about 70μm 
atomic number 52 to 82: 0.05 to about 10μm
Calibration curve Calibration curve auto-create feature 
multi-point calibration curve
Correction function Base correction
application Single-layer plating measurement 
2-layer plating measured 
3-layer plating measurement 
alloy film thickness ratio of components simultaneous measurement 
electroless nickel measurement
Measurement function Automatic measurement 
output style set 
spectrum measurement 
between two points distance measurement
Automatic table function Measurement position designation (XYZ) 
the same pattern repeat function 
origin correction function 
measurement position confirmation function 
automatic calibration
Data processing function Statistics Display: average, standard deviation, maximum, minimum, range, Cp, Cpk 
histogram 
profile display 
measurement data three-dimensional display 
x-R control charts
Safety feature X-ray power key switch 
fail-safe function
Other features Stage coordinate display 
password function 
equipment maintenance
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