Kính hiển vi điện tử quét JEM-F200 JEOL

Mã sản phẩm: JEM-F200 |
Thương hiệu: JEOL

Giá bán: Liên hệ
Kính hiển vi điện tử quét
Model: JEM-F200
Hãng: JEOL


Yêu Cầu Giá Tốt

Thông tin sản phẩm

Advanced Scan system
The JEM-F200 incorporates a new scanning system, which is capable of scanning the electron beam in the image forming system (optional), in addition to the standard scanning system for the probe-forming system. This enables the acquisition of wide field STEM-EELS.


Pico Stage Drive
The JEM-F200 uses a Pico Stage Drive, which is capable of driving the stage in pico meter steps without a piezo drive, and moving the area of view in a wide dynamic range from an entire sample grid down to atomic dimensions.


Smart design
The JEM-F200 has a new, stylish appearance. It incorporates a newly developed intuitive user interface specifically designed for analytical electron microscopy. 
It also features outstanding mechanical and electrical stability, which reflects JEOL’s engineering expertise accumulated over the last decadeds.


Quad-Lens condenser system
Today’s electron microscopes are required to support a wide range of imaging techniques from bright field/dark field TEM to STEM that uses a variety of detectors. The JEM-F200, with its new 4-stage probe-forming optical system, (Quad-Lens condenser) controls the electron beam intensity and the convergence angle independently to respond to different research requirements.


Specporter (auto holder loading/unloading device)
Loading/unloading of a specimen holder has been considered a difficult part of operation, especially for beginners. 
The JEM-F200 incorporates a new device, Specporter, to facilitate automated loading and unloading of the specimen holder by one single click.


Thông số kỹ thuật


Resolution *1

Point to point 0.19 nm
TEM lattice image 0.10 nm
STEM-HAADF image 0.14 nm

Magnification *1

TEM: ×20 to ×2.0 M
STEM: ×200 to ×150 M

Electron gun

Schottky field emission gun or Cold field emission gun

Accelerating voltage *2

20 to 200 kV

Max. specimen tilt angle

±80° (with Specimen High Tilting Holder)



>>> Cách chọn JEM-Z200FSC chính hãng



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