Atomic Force Microscopes TT2-AFM AFM workshop

This compact, second generation tabletop Atomic Force Microscope has all the important features and benefits expected from a light lever AFM. The TT-2 AFM includes a stage, control electronics, probes, manuals, and a video microscope.

Sample Sizes:	Up to 1" X 1" X 3/4"
Standard Scanning Modes:	Vibrating(Tapping), Non Vibrating (Contact), Phase, LFM
Scanners:	50 x 50 x 17 µm, 15 x 15 x 7 µm
Video Optical Microscope:	Zoom to 400X, 2 µm resolution
Stage and Ebox Size:	Compact table top design

50 Micron XYZ Scanner Type Modified Tripod xy Linearity < 1% xy Range > 50 µm xy Resolution < 3 nm closed loop < 1 nm open loop xy Actuator type Piezo xy Sensor type Strain Gauge z Range > 16 µm z Linearity < 5 % Z sensor noise < 1 nm Z feedback noise < 0.15 nm* Z Actuator Type Piezo Z Sensor type Strain Gauge 15 Micron XYZ Scanner Type Modified tripod XY Linearity < 1% XY Range > 15 µm XY resolution < 3 nm closed loop < 0.3 nm open loop XY Actuator type Piezo Sensor type Strain Gauge Z Range > 7 µm Z Linearity < 5 % Z sensor noise < 5 nm Z feedback noise < 0.08 nm* Z Actuator Type Piezo Z Sensor type None Sample Holder Type Magnet Max Lateral Dimensions 1" Max. Height 0.75" Light Lever AFM Force Sensor Probe Types Industry standard Probe insertion Manual – probe exchange tool Probe holding mechanism Clip Vibrating mode piezo Electrical connector to probe Laser/Detector adjustment range +/- 1.5 mm Adjustment resolution 1 µm Minimum Probe to Objective 25 mm Laser Type 670 nm diode, < 1 mw Detector   Type 4 quadrant Band Width > 500 kHz Signals Transmitted TL, BL, TR, BR Gain Lo, High Settings Probe sample angle 10°

50 Micron XYZ Scanner Type Modified Tripod xy Linearity < 1% xy Range > 50 µm xy Resolution < 3 nm closed loop < 1 nm open loop xy Actuator type Piezo xy Sensor type Strain Gauge z Range > 16 µm z Linearity < 5 % Z sensor noise < 1 nm Z feedback noise < 0.15 nm* Z Actuator Type Piezo Z Sensor type Strain Gauge 15 Micron XYZ Scanner Type Modified tripod XY Linearity < 1% XY Range > 15 µm XY resolution < 3 nm closed loop < 0.3 nm open loop XY Actuator type Piezo Sensor type Strain Gauge Z Range > 7 µm Z Linearity < 5 % Z sensor noise < 5 nm Z feedback noise < 0.08 nm* Z Actuator Type Piezo Z Sensor type None Sample Holder Type Magnet Max Lateral Dimensions 1" Max. Height 0.75" Light Lever AFM Force Sensor Probe Types Industry standard Probe insertion Manual – probe exchange tool Probe holding mechanism Clip Vibrating mode piezo Electrical connector to probe Laser/Detector adjustment range +/- 1.5 mm Adjustment resolution 1 µm Minimum Probe to Objective 25 mm Laser Type 670 nm diode, < 1 mw Detector   Type 4 quadrant Band Width > 500 kHz Signals Transmitted TL, BL, TR, BR Gain Lo, High Settings Probe sample angle 10°