Thiết bị đo kích thước ngoài C Pratt & Whitney

Mã sản phẩm: C |
Thương hiệu: Pratt & Whitney

Giá bán: Liên hệ
Thiết bị đo kích thước ngoài
Model: C
Hãng: Pratt & Whitney

Yêu Cầu Giá Tốt

Thông tin sản phẩm

If you're looking for a direct-reading bench micrometer and an electronic size comparator for use in the calibration laboratory or on the production floor, look no further, the third-generation External Supermicrometer Model C provides durability, digital accuracy, speed of measurement, and range of applications.  The Supermicrometer is the most popular bench micrometer in the world that can measure just about any manufactured precision OD part, turned part, or gages such as pins, plugs, and threads including API, NPT, NPTF, Dryseal, BSPP, BSPT, UN (Unified), M Profile (Metric), ACME, Buttress, UTS, UNC, UNF, UNEF, UNS, BSW (Whitworth), BA, BSC, BSF, BSP, to name a few.  The External Supermicrometer Model C is also the industry standard, 3-Wire Thread Measuring System.

Heavy-duty cylindrical bed - Chromium-plated cylinder ensures long life and performance integrity and the rack and pinion drive eliminates movement during the measuring cycle
Adjustable pressure tailstock - Exclusive Electrolimit® tailstock offers adjustable pressure from 2 to 48 ounces (50 to 1350 g) for reliability and optimum performance of your Supermike.  Adjustable pressure is required for thread gage calibration and using 3-wires for Pitch Diameter (PD) measurement.  
Carbide-tipped measuring spindles - Non-rotating measuring spindles have long life, corrosion-free lapped anvils and are calibrated to ultra finish and precision.  A must for measuring thousands of pins or precision components.  
Elevating table - Adjustability allows for presentation of the part to the instrument in a non-influencing manner
Direct-reading, microprocessor-based digital display - Easy-to-read digital display provides direct reading in inch or metric units.  Serial/RS 232 port is included. 
Calibrated analog meter - Establishes the reference zero for taking direct measurements from the microprocessor-based digital display


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