56G/64 Gbit/s Wide Bandwidth: CEI-56G, 400 GbE, FEC Bit Rate
2:1 MUX, 1:2 DEMUX: Expand 28G/32G 2ch BERT to 56G/64G
Max. Variable Amplitude Output: 3.5 Vp-p
TJ/DJ/RJ/Bathtub Jitter, Eye Diagram, Eye Margin Auto-measurements
Jitter Tolerance Tests (using MU181500B)
High Expandability
Sync Pattern Generation and BER Measurements for up to 4 Channels Simultaneously
Emphasis Signal Generation (using MZ1854A, MP1861A 2ch Sync, 57.8 Gbit/s)
PAM4 Signal Generation (using MZ1854A, MP1861A 2ch Sync, 56.2 Gbit/s)
Supports Burst Signal Test
Max. 512 Mbit/ch Programmable Data Pattern
Auto PPG-to-MUX Phase Adjustment at Bit Rate Change using Auto-Alignment Function
Supports SJ, RJ, BUJ, SSC, Dual Tone SJ, Half Period Jitter (Even/Odd Jitter)
SJ Generation with large amount: 0.55 UI @ fm 250 MHz
Crosstalk Tests using Variable Data Skew by using multi-channel
Compact Remote Head: Reduces DUT Connection Cable Losses
Input Sensitivity: 25 mV (typ.), Single-end, Eye height
Versatile Signal Integrity Measurement Functions: Supports CEI-56G, 400 GbE Tests
Excellent Signal Quality and Rx Sensitivity: High-accuracy Measurements of Semiconductor Chip
Intrinsic Random Jitter 200 fs rms (typ.)