- Wide film thickness range （1nm～1mm)
- Thickness measurement using reflection spectrum
- Compact and affordable without compromising high precision
- User friendly software interface.
- Analytical algorisms are Peak-Valley Method, Fast Fourier Transformation (FFT) Method, Non-linear Least-Squares Method and Optimization Method.
- Optical constant analysis (n: Refractive index, k: Extinction coefficient) with Non-linear Least-Squares Method