Benefits:
3.3 µm and 5.2 µm in-situ temperature measurement from near-IR to mid-IR wavelengths
50°C to 1300°C (122°F to 2732°F) temperature range
Up to 250 Hz read rate
Single-channel configuration with selectable/fixed emissivity
Designed for solar thin-film and glass-based processes
High-speed, solid- state detectors
Configurable filter, detector, and optical delivery system
RS-232 communication