- Most commercial ATEs does only functional test and do not carry out DC/AC parameter testing, which are very essential in increasing the fault coverage and for achieving near zero field returns. The testing challenges get worse when the boards are equipped with BS compatible components, DSP chips and CPUs or micro controller based boards. ATE QT2256-640 PXI system is designed as a combination board tester capable of testing highly complex and PCBs employing various techniques on a single platform. It can be easily upgraded to 640 digital channels and with programmable UUT power supplies, IEEE or PXI external instrumentation, Bus cycle signature system, ICE and integrated Boundary scan Test AC/DC parametric testing. The ATE is interfaced to an external host PC using a PCI express interface card allowing a maximum data transfer rate. Most commercial ATEs does only functional test and do not carry out DC/AC parameter testing, which are very essential in increasing the fault coverage and for achieving near zero field returns. The testing challenges get worse when the boards are equipped with BS compatible components, DSP chips and CPUs or microcontroller based boards.
- Upto 640 non multiplexed test channels and per pin programmable drive and sense levels.
- True analog channels with FVMV and FCMV drive and sense levels.
- Integrated boundary scan test with Board functional test with Guided probe backtracking.
- BUS cycle signature test for CPU based boards.
- In-circuit emulation test for DSP based boards.
- Reliable and rugged VPC test fixture interface.
- TPS development for customer specific application.
- PXI Instrumentation application per customer needs.
- Paperless Repair Station