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WaveMaster® Compact Reflex - Surface Topography Measurements of Single Lenses with Shack-Hartmann Sensors

Mã sản phẩm: |
Thương hiệu: Trioptics

Giá bán: Liên hệ

Optimized for ease-of-use and flexibility, the WaveMaster® COMPACT Reflex measures surface profiles using a Shack-Hartmann sensor in reflection.

Yêu Cầu Giá Tốt

Zalo/tell: 0984.843.683

Email: hien@ttech.vn

Thông tin sản phẩm

Key Features

Fast measurement of surface profiles with Shack-Hartmann sensors
Fast and easy adaptable to different sample types
High measurement speed enables high sample throughput
High precision four axes alignment sample holder for submicron position adjustment.
Alignment compensation: Only minimum amount of sample alignment necessary when measuring series of samples
Automatic focusing
The automatic positioning of the wavefront sensor and the telescope in the exit pupil
Real time comparison with wavefront data from master lenses or design files
Point light source with different numerical apertures available (up to 0.95)
Vibration insensitive
Comprehensive software for the measurement and analysis of surfaces with Shack-Hartmann sensors

Applications

The WaveMaster® Compact Reflex can be used for the following applications:

Measuring the surface topography of aspherical lenses, spheres and plane surfaces
Radius measurement

* Local deviation from the best fit sphere
** Depending on radius of curvature and illumination lens
*** Depending on illumination lens and sample diameter

Measurement configuration:	- Surface topography measurement of lens, - Measurement of lens mold and stamp surfaces - Radius of curvature of best fit sphere - Reflection set up
Wavelength:	365 nm, 635 nm
Sample holder:	- Single seat - Manual positioning
Accuracy	< 0.050 µm (RMS)
Repeatability	< 0.005 µm (RMS)
Dynamic range	> 200 µm
Maximum asphericity*	≤ 7°
Measurement frequency	up to 12 Hz
Lateral resolution	138 x 138
Sample diameter	from 0.5 mm up to 17 mm**
Sample radius of curvature	from -20 mm up to 30 mm (-50 to +30 on request)***