| Optical System |
Czerny-Turner grating mount
Single monochromator
Fully symmetrical double-beam |
| Light Source |
Halogen lamp, Deuterium lamp |
| Wavelength range |
190 to 2700 nm (3200 nm, option) |
| Wavelength accuracy |
+/-0.3 nm (at 656.1 nm)
+/-1.5 nm (at 1312.2 nm) |
| Wavelength repeatability |
+/-0.05 nm (UV-Vis), +/-0.2 nm (NIR) |
| Spectral bandwidth (SBW) |
UV-Visible: 0.1, 0.2, 0.5, 1, 2, 5, 10 nm
L2, L5, L10 nm (low stray light mode)
M1, M2 nm (micro cell mode)
NIR: 0.4, 0.8, 1, 2, 4, 8, 20, 40
L8, L20, L40 nm (low stray light mode)
M4, M8 nm (micro cell mode) |
| Stray light |
1 % (198 nm KCL)
0.005 % (220 nm NaI)
0.005 % (340 nm NaNO2)
0.005 % (370 nm NaNO2)
SBW: L2 nm
0.04 % (1420 nm: H2O)
0.1 % (1690 nm: CH2Br2)
SBW: L8 nm |
| Photometric range |
UV-Visible: -4~4 Abs
NIR: -3~3 Abs |
| Photometric accuracy |
+/-0.0015 Abs (0 to 0.5 Abs)
+/-0.0025 Abs (0.5 to 1 Abs)
+/-0.3 %T Tested with NIST SRM 930D |
| Photometric repeatability |
+/-0.0005 Abs (0 to 0.5 Abs)
+/-0.0005 Abs (0.5 to 1 Abs)
Tested with NIST SRM 930D |
| Scanning speed |
10~4000 nm/min (8000 nm/min in preview mode) |
| Slew speed |
UV-Vis: 12,000 nm/min
NIR: 48,000 nm/min |
| RMS noise |
0.00003 Abs
(0 Abs, wavelength: 500 nm, measurement time: 60 sec, SBW :2 nm) |
| Baseline stability |
0.0003 Abs/hour (Wavelength: 250 nm, response: slow and SBW: 2 nm) |
| Baseline flatness |
+/-0.0002 Abs (200 - 2500 nm) |
| Detector |
PMT, Peltier cooled PbS |
| Standard functions |
IQ Accessory, Start Button, Analog output |
| Standard programs |
Abs/%T meter, Quantitative analysis, Spectrum measurement
Time course measurement, Fixed wavelength measurement
Validation, Daily check and Dual wavelength time course measurement |
| Dimensions and weight |
460(W) x 602(D) x 268(H) mm, 29 kg |
| Power requirements |
150 VA |
| Installation requirements |
Room temperature: 15-30 Celsius, humidity: below 85% |