The fastest solution
The high-throughput T5831 delivers the fastest test cycle times for NAND Flash. Key enabling features include ADVANTEST’s Tester-Per-Site™ architecture, which applies the industry’s highest device power supply current per DUT to accelerate program and erase functions. In addition, the system’s on-board hardware conducts on-the-fly analysis of error-correcting codes (ECC), effectively eliminating all overhead time that otherwise would be required for ECC post-processing.
High-efficiency testing
Massive parallel testing and real-time source-synchronous operation maximize the T5831’s productivity and yield. The system automatically fine tunes each test cycle to adjust for timing drifts that arise from changes in process voltage-temperature (PVT) and jitter. Additionally, the tester supports NAND specific test requirements such as bad block management, redundancy analysis and custom/random data generation. Together, these functions ensure NAND quality at maximum yield.
The lowest risk
Built upon the proven reliability and quality of Advantest technologies, the T5831 is a low-risk solution with advantages including software compatibility with the world’s largest installed base of memory test systems. The T5831 also lowers deployment risk by providing turnkey test cell solutions, combining a tester with a handler, a versatile HIFIX line-up, probe cards, and more. Furthermore, the T5831’s modular architecture gives it the extendibility to test future device generations. This forward-looking design allows users to get greater useful lifetime and higher return on investment from their capital expenditures in test equipment.
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