With an operating frequency of 400 MHz, the tester is capable of handling data transfer rates of up to 800 megabits per second (Mbps). In addition, the T5830 can handle up to 2,304 devices under test (DUTs) at one time when configured with four digital pins.
With these features, Advantest’s new tester is ideally suited for handling a wide range of devices including NOR and NAND flash memories that use the standard serial peripheral interface (SPI) protocol, low-pin-count flash devices such as smart cards and single in-line memories (SIM), electrically erasable programmable read-only memories (EEPROMs) and other embedded flash devices.
The T5830 tester is available in both production and engineering models, making the system applicable for qualification testing as well as high-volume production. It is built on the same platform and uses the same FutureSuite™ software as all other members of the T58xx product line. This enhances the system’s reliability and provides modular upgradeability.
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