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Model : CCI MP
Hấng sản xuất : Taylor Hobson
The CCI MP is an advanced type of measurement interferometer (a non contact 3D Profiler). It uses an innovative, patented correlation algorithm to find the coherence peak and phase position of an interference pattern produced by our precision optical scanning unit
The CCI MP is invaluable for many applications requiring high precision 3D profile analysis. A variety of objectives are available and can be fitted simultaneously to the turret, enabling many types of surface to be measured. A fully automated stage and auto measurement routines add to the high level of flexibility.
Versatility is one key benefit of the CCI MP non-contact 3D Profiler. Polished or rough, curved, flat or stepped surfaces with reflectivity between 0.3% and 100% can all be measured using one single algorithm, with no need to change mode for different surfaces and no concerns about the wrong mode being selected. All material types are measurable including: glass, liquid inks, photo resist, metal, polymer and pastes.
- 1048 x 1048 pixel array for large FOV with high resolution
- New improved X, Y and Z stitching, up to 100 mm
- measurement range
- <0.2 Angstrom RMS repeatability, <0.1% step height repeatability
- Angstrom resolution over the entire measurement range
- Windows 7 64-bit software in multi-language