The spectroscopic ellipsometer SENDIRA measures thin film thickness, refractive index, extinction coefficient, and related properties of bulk materials, single layers, and multi-layer stacks. Especially layers below covering layers that are non-transparent in the visible range are now accessible for measurement. Composition of materials and orientation of larger molecule groups and chains can be analyzed.
The SENTECH ellipsometer SENDIRA is especially designed for the infrared (FTIR). The compact table top instrument comprises the purged ellipsometer optics, computer controlled goniometer, horizontal sample platform, auto-collimating telescope, commercial FTIR, and DTGS or MCT detector. The FTIR provides excellent precision and high resolution in the spectral range from 400 cm-1 to 6,000 cm-1 (1.7 µm – 25 µm).