The near-field microprobe is designed for a high-resolution measurement of electrical near fields. With the ICR E probe the following measurements can be performed: - Surface Scan via IC according to IEC 61967-3 - Volumenscan via IC - Pin Scan The measuring electrode at the ICR RF probe head is horizontally aligned to the measurement surface. A preamplifier is integrated into the probe housing and powered by the Bias-Tee. The ICR near field probes undergo a quality check before they are delivered. Different reference setup measurements are performed and resulting correction lines are generated. Two different correction lines are determined -- a standardized correction line and an E-field correction line. Attention: Due to its construction, the ICR probe is sensitive to shock and comes with a protective cap for transport and handling.
Scope of delivery
+ 1xICR E150, Near-Field Microprobe E-field 7 MHz to 3 GHz
+ 1xBT 706, Bias Tee
+ 1xSMA-SMA RA, Cable SMA-SMA, right angle
+ 1xICR Corr, Correction Curves ICR / CD-ROM
+ 1xICR-C, ICR Certificate
+ 1xNT FRI EU, Power Supply Unit
+ 1xICR case1, System Case