- Photoluminescence (PL) is the light emission from a material under the excitation by ultraviolet, visible or near infrared radiation. In semiconductor luminescent property measurements, the sample (e.g. GaN, ZnO, GaAs etc.) was usually excited by a laser (with a wavelength of 325 nm, 532 nm, 785 nm etc.), and its PL spectrum is measured to analyze the optical physical properties, such as the band gap width etc.. Photoluminescence is a high sensitivity, non-destructive analysis method, which can provide the information about the structure, composition and surrounding atomic arrangement of materials. Therefore, it is widely used in physics, materials science, chemistry and molecular biology and other related fields.
- Traditional Photoluminescence microscopic spectrometers are combination of standard microscopes and fluorescence spectrometers, but there are many limitations on PL spectra measurements with the traditional microscope. No flexible access to switch the laser needed in the experiments (especially for UV lasers, no suitable accessories), no convenient matching approach to cryogenic refrigeration machine, extremely low coupling efficiency when using fiber as the light collecting device, are all unavoidable problems while standard microscopes are applied.
- The integration of optical layout -- all optical elements adjustments is only needed in the initial installation, to ensure the efficiency and easy using
- Double light path design – easy to switch the horizontal and vertical optical path, for application on all kinds of sample morphology
- Ultra-wide spectra range -- 200nm-1600nm
- Video monitoring light path -- for accurate sampling point adjustment
- Unique correction function of Emission spectra -- to make the spectral measurements more accurate and comparable
- Multiple excitation wavelength optional -- 325nm, 405nm, 442nm, 473nm, 532nm, 633nm, 785nm etc.
- Automatic mapping function optional -- 50mm × 50mm measurement range, or customized special specifications
- Electroluminescent (EL) feature optional -- extended options
- Microscopic Raman spectroscopy measurement optional -- extended options
- Ultra low temperature measuring accessories optional -- providing measurements at ultra low temperature under 10K