Technical Specifications |
Description |
Measuring Geometry |
Dual Beam d/8° spectrophotometer |
Specular Port |
SCI/SCE for automatic gloss compensation |
Illumination Source |
Pulsed Xenon filtered to approximate D65 |
Wavelength Range |
400 nm – 700 nm |
Reporting Interval |
10 nm |
Photometric Range |
0 to 200% |
Spectral Analyzer |
Proprietary SP2000 analyzer with dual 256 element diode array |
Color Repeatability |
0.05 CIELAB ΔE* max on white ceramic tile |
Inter-Instrument Agreement |
0.2 CIELAB ΔE* avg. of 12 BCRA tiles |
Single Aperture Models |
LAV (22 mm), SAV (9 mm), USAV (6.5 mm) |
Data Interface |
Secure USB or RS232 (optional) |
Operating Environment |
5° to 40°C up to 85% RH, non-condensing |