Materials Test Systems ModuLab XM MTS Ametek Scientific Instrument

Mã sản phẩm: ModuLab XM MTS |
Thương hiệu: Ametek Scientific Instrument

Giá bán: Liên hệ
Materials Test Systems
Mode: ModuLab XM MTS
Hãng: Ametek Scientific Instrument

Yêu Cầu Giá Tốt

Thông tin sản phẩm
The latest generation ModuLab® XM MTS system is designed with modularity and flexibility in mind to allow for a wide range of applications. Purpose built for materials test research the ModuLab XM provides:

I-V (voltage scans with current measurement - used to characterize electronic and dielectric materials)
P-E (polarization / electric field - used to run hysteresis tests to characterize ferroelectric materials) 
High-speed pulse (used to activate charge carriers in electronic and dielectric materials)
Staircase and smooth stepless analog ramp waveforms
Impedance, admittance, permittivity / capacitance, electrical modulus
C-V capacitance - voltage, Mott-Schottky

Automatic sequencing of time domain and impedance/capacitance measurements


Thông số kỹ thuật


General Control Module Slave Modules
100 V High Voltage Femto Ammeter 2 A Booster
XM MAT 1MHz XM MHV100 XM MFA XM MBST 2A
Chassis slots taken Single Single Single Double
Measurement mode 2 or 4 terminal 2 or 4 terminal 2 or 4 terminal 2 or 4 terminal
Sample connections from module Gen, VHi, VLo, I Gen, VHi, VLo
MAT- I
I
MAT- Gen, VHi, VLo
Gen, I
MAT- VHi, VLo
Sample connection cables (1 m length) 4 x BNC to BNC MAT cables Triax to BNC MAT cables
Floating Yes Yes Yes Yes
General Output - (Gen) XM MAT 1 MHz XM MHV100 XM MFA XM MBST 2A
Maximum waveform generator sample rate 64 MS/s
Interpolated/filtered
Uses MAT N/A Uses MAT
Maximum voltage (open circuit load) DC + peak AC
(subject to slew rate limit)
±8 V ±100 V N/A ±8 V with MAT
±20 V with MHV
Maximum voltage resolution 150 μV (< 3 V) 
400 μV (≥ 3 V)
2 mV (< 37 V) 
5 mV (≥ 37 V)
N/A 1.5 mV
Maximum output current ±100 mA ±100 mA N/A ±2 A
Output impedance (nominal) 50 Ω 50 Ω N/A < 1 Ω
Applied voltage error (open-circuit load) ±0.2% setting 
±800 μV (< 3 V) 
/ ±2 mV (≥ 3 V)
±0.2% setting
±12.5 mV (< 37 V) 
/ ±35 mV (≥ 37 V)
N/A ±0.2% setting + 
±10 mV (< 3 V) 
/ ±25 mV (≥ 3 V)
Voltage sweep rate 1.6 MV/s to 1 μV/s 10 MV/s to 1 μV/s N/A 1.6 MV/s to 1 μV/s
Recommended maximum sweep rate
(using 1 MS/s acquisition rate)
25 kV/s 150 kV/s N/A 25 kV/s
Minimum pulse duration 1 μs Uses MAT N/A Uses MAT
Maximum slew rate >10 V/μs >15 V/μs N/A >10 V/μs
Voltage Measurement - (VHi/VLo) XM MAT 1MHz XM MHV100 XM MFA XM MBST 2A
Maximum voltage ±8 V ±100 V N/A N / A
Voltage ranges 8, 3, (V) 
300, 30, 3 (mV)
100, 37.5, 3.75 (V) 
375 , 37.5 (mV)
N/A N / A
Voltage measurement error ±0.1% reading + 
±0.05% range + 
±100 μV
±0.1% reading + 
±0.05% range + 
±100 μV
N/A N / A
Maximum time domain measurement rate 1 MS/s N / A N/A N / A
Maximum time record Unlimited N / A N/A N / A
Current measurement - (I) XM MAT 1MHz XM MHV100 XM MFA XM MBST 2A
Maximum current ±100 mA N / A ±100 mA ±2 A
Current ranges 100 mA, 30 mA to 
30 nA in decades
N / A 100 mA, 30 mA to 
3 pA in decades
2 A plus MAT 
ranges
Maximum resolution 1.5 pA N / A 0.15 fA 1.5 pA (MAT)
Current measurement error ±0.1% reading + 
±0.05% range + 
±100 pA
N / A ±0.1%** reading + 
±0.05% range + 
±30 fA
±0.1% reading + 
±0.05% range + 
±0.1 mA
Auxiliary voltage inputs XM MAT 1MHz XM MHV100 XM MFA XM MBST 2A
Number of auxiliary DC channels Four N / A N/A N / A
Voltage ranges 8 V, 3 V to 3 mV N / A N/A N / A
Maximum resolution 1 μV N / A N/A N / A
Synchronized to VHi, VLo measurement Yes N / A N/A N / A


>>>  Materials Lab XM mới về


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