ImagesMaster® PRO 5 Wafer - MTF Measurement of Wafer Level Optics

Mã sản phẩm: ImagesMaster® PRO 5 Wafer |
Thương hiệu: Trioptics

Giá bán: Liên hệ
The Image Master® PRO 5 Wafer has been designed to meet the requirements of quality assurance within the production of the new generation of wafer level objective lenses i.e. for mobile phone/digital cameras or automotive sensors that are manufactured in large quantities on wafers.

Yêu Cầu Giá Tốt

Thông tin sản phẩm

Key Features

  • Fastest measurement (less than 1 sec. per lens) of MTF in fixed image plane position
  • Highest FFL accuracy for spacer thickness determination
  • Tilt correction function (bow compensation)
  • Measurement traceable to international standards
  • Wafer bow measurement
  • Max wafer diameter up to 8 inch (200 mm) 
    (on request 12inch 300mm)
  • Quick, software-controlled wafer alignment
  • Data processing for next production steps
  • Operation status light indicator
  • Easy loading due to kinematic mount and wafer rotation and shift adjustment tool
  • An assortment of pass and fail criteria allows use of the most suitable criterion for each type of lens
  • Cleanroom compatibility ISO 5


Applications

ImageMaster® PRO 5 Wafer MTF measurement of wafer level optics:

  • MTF on and off axis
  • Effective Focal Length (EFL)
  • Flange Focal Length (FFL)
  • Field curvature
  • Depth of focus
  • Chromatic aberrations
  • Astigmatism
  • Relative distortion
  ImageMaster®
PRO 5 Wafer
Optical set up Infinite-finite conjugates
Max. spatial frequency 400 lp /mm
Accuracy MTF on-axis 1,5 % MTF
Accuracy MTF off-axis 2,5 % MTF
Accuracy EFL 
(Effective Focal Length)
5 µm
Accuracy FFL 
(Flange Focal Length)
4 µm (by distance sensor)
Minimum measurement time 1.0 sec / sample
Average measurement time 2.5 sec / sample
Dimensions 
(height x width x depth)
1350 mm x
1330 mm x
675 mm
Weight 210 kg
Sample holder Wafer tray
Cleanroom class FS 209 / ISO14644-1 100 / ISO 5


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