- Andor’s USB 2.0 ikon-M SO series features high-QE, sensors for direct detection of soft X-Ray EUV or VUV photons. A convenient 16-point, knife-edge sealed 6” rotatable CF152 flange provides a robust and highly-effective seal to any compatible vacuum chamber interface.
- DN100CF / 6” CF / CF-152 flange and knife-edge sealing provided as standard for direct interfacing to vacuum chambers (rotatable design for iKon-M models).
- Choice of acquisition speed or large field-of-view to best match experimental needs.
- Ideal balance of dynamic range and resolution, on-head binning to extend dynamic range.
- High photon collection efficiency for maximising signal-to-noise ratios. ‘Enhanced’ process back-illuminated sensor options for increased QE in the soft x-ray range.
- Efficiently minimizes dark current noise for acquisitions requiring longer sensor exposure time, obtain better signal-to-noise ratios faster.
- Intelligent low-noise electronics offer the most ‘silent’ system noise.
- Slow readout for low noise and best SNR performance, faster speed for studying dynamic processes and 5 MHz focusing mode.
- Built-in robust plug and play interface as standard.
- Tracking stability to ensure all readout circuits experience same temperature and operating conditions.
- Slower readout for lowest noise, faster speeds for more rapid readout and focusing.
- Andor’s user-friendly SDK supports both Windows and Linux OS. LabView VI package available.
- Seamless integration and operation at EPICS-based particle accelerators.
- Accommodate beryllium (or aluminium) windows with thickness down to 200 μm for removal of unwanted lower energy radiations (< 2 keV). Ø45.5 mm supported for iKon-M and Ø60 mm for iKon-L.
- Provides maximum flexibility – camera can attach directly to a vacuum chamber, or be used as standalone with a beryllium filter.