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WaveMaster® Compact Universal - Wavefront and Surface Measurements with Shack-Hartmann Sensors

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Thương hiệu: Trioptics

Giá bán: Liên hệ

The WaveMaster® COMPACT Universal measures lenses in both transmission and reflection with TRIOPTICS' Shack-Hartmann sensor. It is possible to measure the wavefront and surface topography of plano, spherical and aspherical optics with one measurement system by making simple adjustments.

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Email: hien@ttech.vn

Thông tin sản phẩm

Key Features

One measurement instrument for the measurement of the wavefront and surface topography
High measurement speed enables high sample throughput
Fast and easy adaptable to different sample types
High precision four axes alignment sample holder for submicron position adjustment
Only minimum amount of sample alignment necessary when measuring series of samples
Real time comparison with wavefront data from master lenses or design files
High accuracy
Automatic focusing
The automatic positioning of the wavefront sensor and the telescope in the exit pupil
Point light source with different numerical apertures available (up to 0.95)
Vibration insensitive
Comprehensive software for the wavefront and surface measurement with Shack-Hartmann Sensor

Applications

The WaveMaster® Compact Universal uses its built-in Shack-Hartmann sensor to determine the following parameters:

Measurement of the wavefront (PV, RMS) and surface topography
Determination of the Zernike coefficients
Measurement of the Point Spread Function (PSF)
Measurement of the Modulation Transfer Function (MTF)
Measurement of the Strehl ratio
Wedge angle
Measuring the surface topography of aspherical lenses, spheres and plane surfaces
Radius measurement

TRANSMISSION
Measurement configuration:	• Wavefrontmeasurement of lenses • Transmission • Infinite set up
Sample diameter (1):	0.5mm – 14 mm
Sample EFL (2):	-30 – +100 mm
Wavelength (3):	365 nm – 1064 nm
Sample holder:	• Single seat • Manual positioning
Wavefront accuracy	< λ/20 (RMS)
Wavefront repeatability	< λ/200 (RMS)
Dynamic range	> 2000 λ
Measurement frequency	up to 12 Hz
Lateral resolution	138 x 138

REFLECTION
Measurement configuration:	• Surface topography measurement of lens, • Measurement of lens mold and stamp surfaces • Measurement of radius of curvature of best fit sphere • Reflection
Sample size (4):	0.5 mm – 18 mm
Radius of curvature (5):	-50 mm – +30 mm
Wavelength:	365 nm - 635 nm
Sample holder:	• Single seat • Manual positioning
Profile accuracy	< 0.050 µm (RMS)
Profile repeatability	< 0.005 µm (RMS)
Dynamic range	> 200 µm
Maximum asphericity (6)	≤ 7°
Measurement frequency	up to 12 Hz
Lateral resolution	138 x 138

(1) Depending on telescope
(2) Depending on light source
(3) According to customer's choice
(4) Depending on radius of curvature and illumination lens
(5) Depending on illumination lens and sample diameter
(6) Local deviation from the best fit sphere