The SMX-1000 Plus and SMX-1000L Plus X-ray inspection systems are a further refinement of the conventional models(SMX-1000 / SMX-1000L), which have become the benchmarks of the industry.
The operability so well received in the conventional models has been further improved, resulting in simple and easy-to-see windows. Fluoroscopic images and exterior images have been increased in size, providing a new level of visibility.
The measurement functions are much easier to use. Measurement results can now be obtained with a mouse click, with no need for complicated parameter settings.
New functions such as enhanced region-of-interest display have been incorporated, complementing a wealth of conventional functions including navigation via exterior images, step feed, teaching, and image browsing.
Application
Both the SMX-1000 Plus and SMX-1000L Plus provide high-magnification nondestructive fluoroscopic examinations of junction conditions (disconnect, contact) of ultra-micro parts on high-density PCBs, BGAs, CSPs, or system LSIs.
>>> Giá bán USF-2000 chính hãng