Advanced Scan system
The JEM-F200 incorporates a new scanning system, which is capable of scanning the electron beam in the image forming system (optional), in addition to the standard scanning system for the probe-forming system. This enables the acquisition of wide field STEM-EELS.
Pico Stage Drive
The JEM-F200 uses a Pico Stage Drive, which is capable of driving the stage in pico meter steps without a piezo drive, and moving the area of view in a wide dynamic range from an entire sample grid down to atomic dimensions.
Smart design
The JEM-F200 has a new, stylish appearance. It incorporates a newly developed intuitive user interface specifically designed for analytical electron microscopy.
It also features outstanding mechanical and electrical stability, which reflects JEOL’s engineering expertise accumulated over the last decadeds.
Quad-Lens condenser system
Today’s electron microscopes are required to support a wide range of imaging techniques from bright field/dark field TEM to STEM that uses a variety of detectors. The JEM-F200, with its new 4-stage probe-forming optical system, (Quad-Lens condenser) controls the electron beam intensity and the convergence angle independently to respond to different research requirements.
Specporter (auto holder loading/unloading device)
Loading/unloading of a specimen holder has been considered a difficult part of operation, especially for beginners.
The JEM-F200 incorporates a new device, Specporter, to facilitate automated loading and unloading of the specimen holder by one single click.
Thông số kỹ thuật
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Resolution *1
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Point to point 0.19 nm
TEM lattice image 0.10 nm
STEM-HAADF image 0.14 nm
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Magnification *1
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TEM: ×20 to ×2.0 M
STEM: ×200 to ×150 M
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Electron gun
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Schottky field emission gun or Cold field emission gun
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Accelerating voltage *2
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20 to 200 kV
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Max. specimen tilt angle
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±80° (with Specimen High Tilting Holder)
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>>> Cách chọn JEM-Z200FSC chính hãng