The JEM-2200FS includes electron optics completely free of rotation which allows for the simplified allocation of TEM images and diffraction patterns. The patented JEOL Alpha Selector™ makes easy selection of the illumination conditions for the user possible, ranging from an extreme convergent beam to parallel illumination.
The newly designed side-entry goniometer with five-axis motorization permits programmable saving and recalling of positions. Piezo elements for the x/y motion of the goniometer are integrated as a standard for absolute jerk-free movement of the specimen.
The extremely stable goniometer has been specially designed for tomography with high tilt angles. The image series is acquired automatically using the optional JEOL tomography software TEMography™, a 3-D reconstruction is calculated and the reconstructed object is displayed using 3-D visualization software.
Thông số kỹ thuật
| Electron optics |
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Electron source
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Field emissions source (Schottky)
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Acceleration voltage
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80 to 200 kV
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Point resolution
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up to 0.19 nm (UHR pole piece)
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Line resolution
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0.14 nm
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Magnification range
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x50 to max. x1,500,000
(depending on the pole piece)
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>>> Giá bán JEM-2800