Sharp silicon probes that allow a direct visualization of the AFM tip as it engages the sample surface
Nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging
Several variations to suit different modes of AFM and special applications like EFM
Uncoated/gold coated (reflex side) probes are suitable for applications in air/liquid
Uncoated/aluminum coated (reflex side) probes are suitable for applications in air
Both sides gold coated (GG) probes are recommended for functionalization/non-contact electric force microscopy studies like Electrostatic Force Microscopy/KPFM etc.
Platinum-Iridium (Pt-Ir) coated probes are recommended for contact EFM as well as PFM, KPFM etc.,
Doped Diamond (DD) probes are ideal choice for Contact as well as Tapping™ electrical force microscopy applications like SSRM, PFM, EFM, KPFM etc
Thông số kỹ thuật
| Cantilever Specs. * |
| k (N/m) |
0.3 |
| f (kHz) |
16 |
| Length (μm) |
450 |
| Width (μm) |
49 |
| Thickness (μm) |
2.5 |
| Coating (reflex side) |
None/Al |
| Special option |
Au |
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